Secondary Ion Mass Spectrometer

Product Overview

We are indulged in making and supplying of Secondary Ion Mass Spectrometer from Pune, Maharashtra, India. IMS 7F Universal Magnetic Sector SIMS : Used in Semiconductor R & D, Materials, Nuclear Sciences, environmental applications. Provides high sensitivity Trace Element Depth Profiling and Secondary Ion Microscopy, PPB level detection limits. High throughput and consistent reliability are the strong points. IMS 7 F Geo and IMS 7FR and the specific versions.

2025nd Year

Contact Person

Plot No No. C 1, Rachana house, CTS no. 122, 9/BFP No. 615/B, Next to Sagar Arcade, FC Road,